Structural and Electrical Characterization of High-Knano Crystalline Erbium Oxide

The effect of different annealing temperatures on the crystalline structure, average crystallite size, porosity, specific surface area, dislocation density and strain are studied through x-ray diffraction at room temperature. The morphology and the composition of the specimen were checked through the Scanning Electron Microscopy (SEM) and EDX respectively. The dielectric constant, loss factor are measured in the frequency range of 20Hz to 3MHz at room temperature. The ac conductivity in this frequency was determined using the dielectric parameters.Er2O3 may be useful as a gate dielectric.

Keywords: Ac conductivity, X-ray diffraction, Dielectrics, Specific surface area, Dielectric parameters.